Systems and Means of Informatics
2020, Volume 30, Issue 3, pp 49-55
SELF-TIMED PIPELINE IMMUNITY TO SOFT ERRORS IN ITS COMBINATIONAL PART
- Yu. A. Stepchenkov
- Yu. G. Diachenko
- Yu. V. Rogdestvenski
- N. V. Morozov
- D. Yu. Stepchenkov
- D. Yu. Diachenko
Abstract
The paper estimates the data corruption probability in self-timed circuits manufactured by a standard 65-nanometer and below CMOS process because of short-term soft errors that occurred in the pipeline combinational part. Soft errors appear as a result of the external causes and internal noise sources. The paper analyzes events able to lead to data corruption in the pipeline due to soft errors. In the worth case, self-timed pipeline is naturally immune to 84.4% soft errors in its combinational part due to self-timed circuit features.
Proposed layout synthesis techniques increase soft error tolerance of the pipeline up to 85.6%. Indication of the state of the paraphase signal, inversed to its spacer, as spacer provides self-timed pipeline immunity to 98.6% of single soft errors at the expanse of pipeline hardware complexity by less than 1 %.
[+] References (3)
- Holmes-Siedle, A., and L. Adams. 2002. Handbook of radiation effects. 2nd ed. Oxford University Press. 640 p.
- Kishinevsky, M., A. Kondratyev, A. Taubin, and V. Varshavsky. 1994. Concurrent hardware: The theory and practice of self-timed design. J. Wiley & Sons. 368 p.
- Stepchenkov, Yu. A., Yu. G. Diachenko, Yu.V. Rozhdestvenski, et al. 2020. Ustoychivost' samosinkhronnykh kombinatsionnykh skhem k kratkovremennym logicheskim sboyam [Self-timed combinational circuit tolerance to short-term soft errors]. Sistemy
i Sredstva Informatiki - Systems and Means of Informatics 30(2):4-10.
[+] About this article
Title
SELF-TIMED PIPELINE IMMUNITY TO SOFT ERRORS IN ITS COMBINATIONAL PART
Journal
Systems and Means of Informatics
Volume 30, Issue 3, pp 49-55
Cover Date
2020-11-10
DOI
10.14357/08696527200305
Print ISSN
0869-6527
Publisher
Institute of Informatics Problems, Russian Academy of Sciences
Additional Links
Key words
self-timed circuit; soft error tolerance; pipeline
Authors
Yu. A. Stepchenkov  , Yu. G. Diachenko , Yu. V. Rogdestvenski , N. V. Morozov , D. Yu. Stepchenkov , and D. Yu. Diachenko
Author Affiliations
Institute of Informatics Problems, Federal Research Center "Computer Science
and Control", Russian Academy of Sciences, 44-2 Vavilov Str., Moscow 119333, Russian Federation
|